活动_测控技术与仪器网http://www.v-testing.com/2026-05-13 05:23:30<![CDATA[IRF2020年北京国际雷达博览会]]>http://www.v-testing.com/exhibit/show.php?itemid=482017-08-25 15:45:26<![CDATA[2020中国国际国防电子展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=392017-05-24 15:20:25<![CDATA[2020慕尼黑电子展]]>http://www.v-testing.com/exhibit/show.php?itemid=452017-05-22 23:04:24<![CDATA[2020国际电磁兼容暨微波展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=462017-05-20 23:07:40<![CDATA[第十四届中国国际机器视觉展览会暨机器视觉技术及工业应用研讨会]]>http://www.v-testing.com/exhibit/show.php?itemid=472017-05-11 23:15:18<![CDATA[2017第六届中国国防信息化技术与装备展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=442017-01-31 22:51:58<![CDATA[2016国际质量检测分析技术及测量测试仪器仪表展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=382015-09-24 14:06:30<![CDATA[2016中国国际航空航天博览会]]>http://www.v-testing.com/exhibit/show.php?itemid=432015-08-30 14:36:40<![CDATA[2015 NI自动化测试系统技术研讨会]]>http://www.v-testing.com/exhibit/show.php?itemid=412015-08-24 15:30:52<![CDATA[EDI CON China 2016]]>http://www.v-testing.com/exhibit/show.php?itemid=372015-05-24 13:58:58<![CDATA[慕尼黑展览（上海）电子展]]>http://www.v-testing.com/exhibit/show.php?itemid=362015-05-24 13:55:37<![CDATA[IEEE AUTOTESTCON 2015]]>http://www.v-testing.com/exhibit/show.php?itemid=352015-05-24 13:44:29<![CDATA[NIDays 2015—全球图形化系统设计盛会]]>http://www.v-testing.com/exhibit/show.php?itemid=402015-04-24 15:27:53<![CDATA[The PXI Show]]>http://www.v-testing.com/exhibit/show.php?itemid=422015-03-24 15:40:21<![CDATA[2014汽车测试及质量监控博览会]]>http://www.v-testing.com/exhibit/show.php?itemid=292015-01-24 14:17:26<![CDATA[慕尼黑上海电子展]]>http://www.v-testing.com/exhibit/show.php?itemid=342015-01-19 16:43:47<![CDATA[2015电子设计创新会议]]>http://www.v-testing.com/exhibit/show.php?itemid=322015-01-19 16:30:46<![CDATA[2015国际质量检测分析技术及测量测试仪器仪表展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=332015-01-01 16:37:32<![CDATA[The PXI Show 2014 China]]>http://www.v-testing.com/exhibit/show.php?itemid=312014-07-01 00:11:34<![CDATA[中国国际微波及天线技术展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=302014-03-27 10:55:40<![CDATA[第十三届国际电磁兼容暨微波展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=282014-01-24 11:48:43<![CDATA[2014年国际无线会议]]>http://www.v-testing.com/exhibit/show.php?itemid=272014-01-24 11:36:48<![CDATA[2014年中国（成都）电子展]]>http://www.v-testing.com/exhibit/show.php?itemid=262014-01-24 11:29:16<![CDATA[2014电子设计创新会议]]>http://www.v-testing.com/exhibit/show.php?itemid=252014-01-24 11:09:14<![CDATA[PXI测控仪器产品及应用技术交流会]]>http://www.v-testing.com/exhibit/show.php?itemid=242014-01-05 01:02:50<![CDATA[PXI总线测控仪器技术交流会]]>http://www.v-testing.com/exhibit/show.php?itemid=232014-01-05 00:52:31<![CDATA[NI 嵌入式系统设计创新研讨会]]>http://www.v-testing.com/exhibit/show.php?itemid=222014-01-05 00:37:26<![CDATA[NI 数据采集技术研讨会]]>http://www.v-testing.com/exhibit/show.php?itemid=212014-01-05 00:33:32<![CDATA[第九届中国国际国防电子展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=202014-01-05 00:01:30<![CDATA[慕尼黑上海电子展]]>http://www.v-testing.com/exhibit/show.php?itemid=192014-01-04 23:50:36<![CDATA[2014国际质量检测分析技术及测量测试仪器仪表展览会]]>http://www.v-testing.com/exhibit/show.php?itemid=182014-01-04 23:39:08<![CDATA[IEEE AUTOTEST 2014]]>http://www.v-testing.com/exhibit/show.php?itemid=172014-01-04 23:11:06