The project has been driven by the customer’s desire to standardize on a test platform for MEMS sensors that provides high throughput, parallelism, and accuracy. The implementation has been proven to support very small deltas in temperature and reference voltage seen by the DUT and reference sensor, which is necessary for successful calibration.

With Xcerra’s integrated and prevalidated test cell the customer benefits from high parallelism and throughput for lower cost of test. The highly stable pressure, temperature, and reference voltage allows for precise calibration and higher yields. Fast settling times for multiple pressure changes allow for higher throughput. The Xcerra TCI project of integrating the InStrip handler and the Diamondx ATE (serial and GPIB communications) has been combined with the performance optimization of the InBaro test module for this specific application. The deployed low force Pogo pin contacting solution and the reliable InCarrier handling ensure highest yield of the sensitive and small packages used for this application.

For future business the customer is able to fully leverage the flexibility of Xcerra’s TCI solution to redeploy the equipment for other sensor applications and use the Multitest InCarrier for WLCSP devices.